Imada, S., Suga, S., Kuch, W. and Kirschner, J.
Surface Review and Letters 9, pp 877-881 (2002) The benefits of combining soft X-ray magnetic circular dichroism and photoelectron microscopy are demonstrated by applying this combination (XMCD-PEEM) not only to magnetic domain imaging but also to quantitative evaluation of the distribution of spin and orbital magnetic moments. The latter takes full advantage of the spectroscopic aspect of XMCD-PEEM.
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