Kotsugi , M., Kuch , W., Offi , F., Chelaru , L. I., Kirschner , J.
Review of Scientific Instruments 74, pp 2754-2758 (2003)
We demonstrate the use of a photoelectron emission microscope in connection with a retarding field electron energy analyzer for the fast acquisition of two-dimensional momentum resolved photoelectron angular distribution patterns. This opens the possibility to combine spatial, momentum, and energy resolution of photoelectrons within the same instrument. We have applied this to observe the Cu(001) Fermi surface from a selected region of the sample. A well defined bulk Fermi surface is quickly mapped in this way.
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