X-ray structure analysis of the Fe/MgO/Fe(001) tunneling-magneto-resistance system

Research report (imported) 2005 - Max Planck Institute of Microstructure Physics

Authors
Meyerheim, Holger L.
Departments
Summary
Using surface sensitive x-ray diffraction the geometric structure of the Fe/MgO/Fe(001) Tunneling-Magneto-Resistance (TMR) device was investigated. Evidence for the formation of an FeO-like interface layer could be provided, which significantly influences the magnitude of the TMR-effect

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