Advanced Techniques in Electron Microscopy

Symposium

  • Date: Jan 31, 2019
  • Location: Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, 06120 Halle (Saale)
  • Room: Lecture Hall Building B
  • Host: Max-Planck-Institut für Mikrostrukturphysik
Advanced Techniques in Electron Microscopy

Transmission electron microscopy offers numerous methods to analyze not only the microstructure of materials down to an atomic level but also to investigate phenomena in solid state physics. During the last decade, a substantial improvement in all fields of TEM could be achieved including structure imaging, diffraction, spectroscopy, imaging of internal fields, but also the observation of dynamic processes. Our goal is to bring together experts from different fields of transmission electron microscopy to discuss such an application of advanced techniques in materials sciences and solid state physics.  The talks will focus on:

in-situ TEM of surface reactions, holography, quantitative TEM, in-situ Lorentz TEM, HREM of nanostructures, defects and interfaces. At the end of the afternoon sessions, a comprehensive discussion of the presented subjects is planned.

Another occasion of this symposium concerns the farewell of our co-worker/colleague Dr. Peter Werner, who was working in the field of TEM here at the Institute for nearly 40 years.

Register here.

Program

  • 9:45 – 10:00

    Stuart S.P. Parkin, MPI Halle, Germany

    Welcome -  Opening of symposium – Advanced needs of TEM

  •  10:00 – 10:45

    Michael Lehmann, TU Berlin, Germany

    Off-axis electron holography: Basics, applications, and perspectives

  •  10:45 – 11:15

    Coffee break

  •  11:15 – 12:00

    Wouter Van den Broek, Humboldt University Berlin, Germany

    New methods in quantitative TEM

  •  12:00 – 12:45

    Armin Feist, University Göttingen, Germany

    Next-Generation Ultrafast Transmission Electron Microscopy (UTEM) - Femtosecond resolution with a high coherence electron beam

  •  13:00 – 14:00

    Lunch break

  •  14:00 – 14:45

    Alain Claverie, CEMES-CNRS, nMat group,Toulouse, France

    Dark-field electron holography reveals the impact processing steps onto the strain distributions in FDSOI CMOS planar devices

  •  14:45 – 15:30

    Ralf Wehrspohn, IMWS Halle, Germany

    The past and future of TEM at Weinberg Campus

  •  15:30 – 16:00

    Afternoon refreshments

  •  16:00 – 16:45

    Marc Willinger, ETH Zurich, Switzerland

    Multi-scale observation of catalyst dynamics under reactive conditions

  •  16:45 – 17:30

    Rana Saha, MPI Halle, Germany

    In situ investigations of non-collinear spin textures by Lorentz transmission electron microscopy

  •  17:30 – 18:00

    Chair: Stuart S.P. Parkin, MPI Halle, Germany

    Joint panel discussion of all speakers: Present and future of TEM

  •  18:00 – 19:00

    Dinner

  •  19:00 – 21:00

    Poster session

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